Circuit modeling of the LM124 operational amplifier for analog single-event transient analysis
Circuit modeling of the LM124 operational amplifier for analog single-event transient analysis
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DOI:
10.1109/tns.2002.805400
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发表时间:
2002
影响因子:
1.8
通讯作者:
Y. Boulghassoul;L. Massengill;A. Sternberg;R. Pease;S. Buchner;J. Howard;D. McMorrow;M. Savage;C. Poivey
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文献类型:
--
作者:
Y. Boulghassoul;L. Massengill;A. Sternberg;R. Pease;S. Buchner;J. Howard;D. McMorrow;M. Savage;C. Poivey
This work presents the development of a transistor-level circuit model of the LM124 operational amplifier specifically engineered and calibrated for analog single-event transient (ASET) computer simulations. The techniques presented rely heavily on datasheet specifications for electrical parameterization and experimental laser probing for dc and transient calibration. The resulting circuit model proves to be suitable for broad-beam SET predictions and fault diagnostics for space applications.