Circuit modeling of the LM124 operational amplifier for analog single-event transient analysis

Circuit modeling of the LM124 operational amplifier for analog single-event transient analysis
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DOI:
10.1109/tns.2002.805400
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发表时间:
2002
影响因子:
1.8
通讯作者:
Y. Boulghassoul;L. Massengill;A. Sternberg;R. Pease;S. Buchner;J. Howard;D. McMorrow;M. Savage;C. Poivey
Y. Boulghassoul;L. Massengill;A. Sternberg;R. Pease;S. Buchner;J. Howard;D. McMorrow;M. Savage;C. Poivey
中科院分区:
工程技术3区
文献类型:
--
作者:
Y. Boulghassoul;L. Massengill;A. Sternberg;R. Pease;S. Buchner;J. Howard;D. McMorrow;M. Savage;C. Poivey

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这项工作介绍了LM124运算放大器的晶体管级电路模型的开发,该模型是专门为模拟单粒子瞬变(ASET)计算机模拟而设计和校准的。提出的技术在很大程度上依赖于电气参数的数据表规范,以及用于直流和瞬变校准的实验激光探测。所得到的电路模型被证明适用于空间应用的宽波束集预测和故障诊断。
This work presents the development of a transistor-level circuit model of the LM124 operational amplifier specifically engineered and calibrated for analog single-event transient (ASET) computer simulations. The techniques presented rely heavily on datasheet specifications for electrical parameterization and experimental laser probing for dc and transient calibration. The resulting circuit model proves to be suitable for broad-beam SET predictions and fault diagnostics for space applications.