Comparison of ferroelectric domain assemblages in Pb(Zr,Ti)O3 thin films and bulk ceramics
Comparison of ferroelectric domain assemblages in Pb(Zr,Ti)O3 thin films and bulk ceramics
复制标题
Pb(Zr,Ti)O3 薄膜和块体陶瓷中铁电畴组合的比较
DOI：
--
复制
发表时间：
1999
期刊：
影响因子：
--
通讯作者：
T. J. Garino
中科院分区：
文献类型：
--
作者：
B. Tuttle;T. Headley;C. Drewien;J. Michael;J. Voigt;T. J. Garino
摘要：块体和薄膜 Pb(Zr,Ti)O3 (PZT) 陶瓷的铁电畴组合的特征是晶粒尺寸的函数。具体来说，将化学制备的块状 PZT 95/5（菱面体对称）陶瓷的域形貌与成分范围从 PZT 20/80 到 PZT 53/47 的四方扭曲钙钛矿 PZT 薄膜进行比较。透射电子显微镜（TEM）、电子通道衬度成像（ECCI）和背散射电子菊池图案（BEKP）是结构表征的主要手段。 TEM 箔中的畴形态具有最小的机械约束，与机械约束到基板的 PZT 薄膜的 ECCI 确定的畴形态以及表现出内应力的块体陶瓷的畴形态非常相似。虽然作为晶粒尺寸函数的准静态 90° 型畴图案对于体铁电体和薄膜铁电体来说是相似的，但对于 PZT 薄膜和体材料来说，90° 畴动态却有很大不同。
Abstract Ferroelectric domain assemblages of bulk and thin film Pb(Zr,Ti)O3 (PZT) ceramics are characterized as a function of grain size. Specifically, domain morphologies of chemically prepared, bulk PZT 95/5 (rhombohedral symmetry) ceramics are compared to tetragonally distorted perovskite PZT thin films of composition ranging from PZT 20/80 to PZT 53/47. Transmission electron microscopy (TEM), electron channel contrast imaging (ECCI) and backscattered electron Kikuchi patterns (BEKP) are the primary means of structural characterization. Domain morphologies in TEM foils, which have minimal mechanical constraints, are to first order very similar to domain morphologies determined by ECCI of PZT thin films mechanically constrained to substrates and to those of bulk ceramics exhibiting internal stress. While quasistatic 90° type domain patterns as a function of grain size are similar for both bulk and thin film ferroelectrics, 90° domain dynamics are substantially different for PZT thin film and bulk materi...