Recombination line intensities for hydrogenic ions - II. Case B calculations for C VI, N VII and O VIII
Recombination line intensities for hydrogenic ions - II. Case B calculations for C VI, N VII and O VIII
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氢离子的重组线强度 - II。
DOI：
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发表时间：
1988
期刊：
影响因子：
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通讯作者：
D. G. Hummer
中科院分区：
文献类型：
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作者：
P. Storey;D. G. Hummer
在延伸的、光学薄的、光电离等离子体中形成的重组谱线的强度，如在PN区、H区和某些热恒星的风中发现的等离子体，是化学丰度的重要信息来源，有时可以提供电子温度的估计。本文计算了cvi、nvii和oviii复合谱线的强度，同时考虑了电子碰撞和重粒子碰撞，并假设Baker和Menzel的情形B。说明了计算过程。当n(u)小于等于50，n(l)小于等于29时，在log n(e) = 4(1)13和10个电子温度值（10,000 K至500,000 K）范围内，由n(u) - n(l)跃迁形成的谱线强度表示。
The intensities of recombination lines formed in extended, optically thim, photoionized plasmas such as those found in PN, H II regions, and winds of certain hot stars are an important source of information on chemical abundances and can sometimes provide estimates of electron temperature. In this paper, the intensities of the recombination lines of C VI, N VII, and O VIII are calculated, accounting for both electron and heavy particle collisions and assuming case B of Baker and Menzel. The computational procedure is explained. The intensities of lines formed by transitions n(u) - n(l) are tabulated for n(u) of 50 or less, n(l) of 29 or less, at log N(e) = 4(1)13 and 10 values of electron temperature in the interval 10,000 K to 500,000 K.