A multi-crystal wavelength dispersive x-ray spectrometer
A multi-crystal wavelength dispersive x-ray spectrometer
复制标题
DOI：
10.1063/1.4737630
复制
发表时间：
2012-07-01
影响因子：
1.6
通讯作者：
Bergmann, Uwe
中科院分区：
文献类型：
--
作者：
Alonso-Mori, Roberto;Kern, Jan;Bergmann, Uwe
本文介绍了一种具有高能量分辨率和大立体角收集的多晶波长色散硬x射线谱仪。该仪器专为X射线自由电子激光（XFEL）和同步辐射设备上的X射线发射光谱（XES）和X射线拉曼散射（XRS）的时间分辨应用而设计。它还简化了整个2D RIXS平面的共振非弹性X射线散射（RIXS）研究。光谱仪是基于冯哈莫斯几何。这种色散设置使XES或XRS光谱能够以单次发射模式进行测量，克服了罗兰圆光谱仪的扫描需求。与XFEL时间剖面和高通量相结合，它是研究含时系统动力学的有力工具。光诱导过程和快速催化反应动力学，范围从飞秒到毫秒，将在一系列广泛的系统中解决辐射损伤。(C)2012年美国物理学会。[http：//dx.doi.org/10.1063/1.4737630]
A multi-crystal wavelength dispersive hard x-ray spectrometer with high-energy resolution and large solid angle collection is described. The instrument is specifically designed for time-resolved applications of x-ray emission spectroscopy (XES) and x-ray Raman scattering (XRS) at X-ray Free Electron Lasers (XFEL) and synchrotron radiation facilities. It also simplifies resonant inelastic x-ray scattering (RIXS) studies of the whole 2d RIXS plane. The spectrometer is based on the Von Hamos geometry. This dispersive setup enables an XES or XRS spectrum to be measured in a single-shot mode, overcoming the scanning needs of the Rowland circle spectrometers. In conjunction with the XFEL temporal profile and high-flux, it is a powerful tool for studying the dynamics of time-dependent systems. Photo-induced processes and fast catalytic reaction kinetics, ranging from femtoseconds to milliseconds, will be resolvable in a wide array of systems circumventing radiation damage. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4737630]