Design-for-testability-based external test and diagnosis of mesh-like network-on-a-chips
Design-for-testability-based external test and diagnosis of mesh-like network-on-a-chips
复制标题
基于可测试性设计的网状片上网络的外部测试和诊断
DOI：
--
复制
发表时间：
2009
影响因子：
1.2
通讯作者：
R. Ubar
中科院分区：
文献类型：
--
作者：
J. Raik;V. Govind;R. Ubar
该研究提出了一种在常规网状片上网络(NoC)设计中测试和诊断的新概念。该方法基于功能故障模型，实现了包地址驱动的测试配置。如将显示的，这样的配置可以应用于实现网络交换机近100%的结构性故障覆盖。此外，还引入了功能交换机故障的概念，称为链路故障。该方法是可扩展的(复杂性随着交换机数量的增加而线性增长)，并且能够明确地定位交换网络内部的故障链路。本论文还提出了一套可测试性设计(DFT)技术，用于从NoC的外部边界应用测试模式。作者实现了一个可参数化的交换网络，并开发了一套DFT结构，以支持使用外部测试配置对网络交换机进行测试。提出的结构包括用于测试资源连接的交叉开关复用器的资源环回、对控制部分的修改以强制YX路由以及用于控制单元的紧凑逻辑内建自测试(BIST)。实验表明，所提出的结构以不到4%的额外开关面积为代价实现了接近100%的测试覆盖率。
The study proposes a new concept of test and diagnosis in regular mesh-like network-on-a-chip (NoC) designs. The method is based on functional fault models and it implements packet address driven test configurations. As it will be shown, such configurations can be applied for achieving near-100% structural fault coverage for the network switches. Additionally, a concept of functional switch faults, called link faults, is introduced. The approach is scalable (complexity grows linearly with respect to the number of switches) and it is capable of unambigously pinpointing the faulty links inside the switching network. Current paper also presents a set of design-for-testability (DfT) techniques for the application of test patterns from the external boundary of a NoC. The authors have implemented a parametrisable switching network and developed a set of DfT structures to support testing of network switches using external test configurations. The proposed structures include resource loopback for testing the crossbar multiplexer of the resource connection, a modification to the control part to force YX routing and a compact logic built-in self test (BIST) for the control unit. Experiments show that the proposed structures allow near-100% test coverage at the expense of less than 4% of extra switch area.