CSST: An Efficient Secure Split-Test for Preventing IC Piracy
CSST: An Efficient Secure Split-Test for Preventing IC Piracy
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CSST：防止 IC 盗版的高效安全拆分测试
DOI：
10.1109/natw.2014.17
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发表时间：
2014
期刊：
影响因子：
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通讯作者：
M. Tehranipoor
中科院分区：
文献类型：
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作者：
Md. Tauhidur Rahman;Domenic Forte;Quihang Shi;Gustavo K. Contreras;M. Tehranipoor
随着现代IC制造的高成本，大多数半导体公司已经走向无工厂化，即，他们将设计的制造外包给代工厂。这种横向业务模式导致了许多与不受信任的代工厂相关的问题，包括IC生产过剩和运输不正确或测试不足的芯片。在供应链中进入这种芯片对于关键应用来说可能是灾难性的。我们提出了一个新的安全分割测试，让测试控制权回到IP所有者。每个芯片在测试期间都被锁定。IP所有者是唯一可以解释锁定的测试结果并解锁通过芯片的实体。通过这种方式，SST可以防止生产过剩和有缺陷的芯片到达供应链。与原始版本的安全分割测试相比，所提出的方法大大简化了代工厂和IP所有者之间所需的通信。结果表明，我们的新技术比原来的更安全，更少的通信障碍。
With the high costs associated with modern IC fabrication, most semiconductor companies have gone fabless, i.e., they outsource manufacturing of their designs to contract foundries. This horizontal business model has led to many well documented issues associated with untrusted foundries including IC overproduction and shipping improperly or insufficiently tested chips. Entering such chips in the supply chain can be catastrophic for critical applications. We propose a new Secure Split-Test to give control over testing back to the IP owner. Each chip is locked during test. The IP owner is the only entity who can interpret the locked test results and unlock passing chips. In this way, SST can prevent shipping overproduction and defective chips from reaching the supply chain. The proposed method considerably simplifies the communication required between the foundry and IP owner compared to the original version of the secure split test. The results demonstrate that our new technique is more secure than the original and with less communication barriers.