Robust Search Algorithms for Test Pattern Generation
Robust Search Algorithms for Test Pattern Generation
复制标题
用于生成测试模式的稳健搜索算法
DOI：
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发表时间：
1997
期刊：
影响因子：
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通讯作者：
K. Sakallah
中科院分区：
文献类型：
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作者：
Joao Marques;K. Sakallah
近年来，已经提出了几种高效的测试模式自动生成算法。然而，这些算法中的大多数往往依赖于不同类型的启发式算法来获得良好的经验性能。此外，还没有重大的研究工作来开发健壮的算法，因为它们可以在很少的启发式指导下处理大多数错误。在本文中，我们描述了一种健壮的、仍然非常有效的ATPG算法。与已有的ATPG算法相比，该算法将启发式知识减少到最低限度，并依靠优化的搜索算法来有效地剪枝搜索空间。尽管实验结果是使用建立在命题可满足性(SAT)算法之上的ATPG工具获得的，但相同的概念可以集成到特定于应用的算法上。
In recent years several highly effective algorithms have been proposed for Automatic Test Pattern Generation (ATPG). Nevertheless, most of these algorithms too often rely on different types of heuristics to achieve good empirical performance. Moreover there has not been significant research work on developing algorithms that are robust, in the sense that they can handle most faults with little heuristic guidance. In this paper we describe an algorithm for ATPG that is robust and still very efficient. In contrast with existing algorithms for ATPG, the proposed algorithm reduces heuristic knowledge to a minimum and relies on an optimized search algorithm for effectively pruning the search space. Even though the experimental results are obtained using an ATPG tool built on top of a Propositional Satisfiability (SAT) algorithm, the same concepts can be integrated on application-specific algorithms.