Exploring Dephasing of a Solid-State Quantum Emitter via Time- and Temperature-Dependent Hong-Ou-Mandel Experiments.
Exploring Dephasing of a Solid-State Quantum Emitter via Time- and Temperature-Dependent Hong-Ou-Mandel Experiments.
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DOI：
10.1103/physrevlett.116.033601
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发表时间：
2015-07
影响因子：
8.6
通讯作者：
Alexander Thoma;Peter Schnauber;M. Gschrey;M. Seifried;J. Wolters;J. Schulze;A. Strittmatter;S. Rodt;A. Carmele;A. Knorr;T. Heindel;S. Reitzenstein
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作者：
Alexander Thoma;Peter Schnauber;M. Gschrey;M. Seifried;J. Wolters;J. Schulze;A. Strittmatter;S. Rodt;A. Carmele;A. Knorr;T. Heindel;S. Reitzenstein
我们通过依赖于时间和温度的双光子干涉（TPI）实验研究了半导体量子点（QD）发射光子的不可逆性。连续光子发射事件之间的时间间隔的增加揭示了在纳秒时间尺度上TPI可见性的降低，理论上由与QD附近的波动电荷陷阱一致的非马尔可夫噪声过程描述。声子诱导的纯退相导致TPI可见度从10 K时的（96±4）%下降到40 K时的消失可见度。与迈克尔逊型测量相反，我们的实验提供了在纳秒时间尺度上直接获得量子发射体的时间相关相干性的方法。
We probe the indistinguishability of photons emitted by a semiconductor quantum dot (QD) via time- and temperature-dependent two-photon interference (TPI) experiments. An increase in temporal separation between consecutive photon emission events reveals a decrease in TPI visibility on a nanosecond time scale, theoretically described by a non-Markovian noise process in agreement with fluctuating charge traps in the QD's vicinity. Phonon-induced pure dephasing results in a decrease in TPI visibility from (96±4)% at 10 K to a vanishing visibility at 40 K. In contrast to Michelson-type measurements, our experiments provide direct access to the time-dependent coherence of a quantum emitter on a nanosecond time scale.