A Study on the Structural Hole of Patent Applicant Network in R&D Management
A Study on the Structural Hole of Patent Applicant Network in R&D Management
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DOI:
10.5954/icarob.2016.os9-1
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发表时间:
2016-01
期刊:
影响因子:
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通讯作者:
I. Nakaoka;Yousin Park;Yunju Chen
中科院分区:
文献类型:
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作者:
I. Nakaoka;Yousin Park;Yunju Chen