Optimization of lateral resolution in magnetic force microscopy
Optimization of lateral resolution in magnetic force microscopy
复制标题
磁力显微镜横向分辨率的优化
DOI：
--
复制
发表时间：
1998
期刊：
影响因子：
--
通讯作者：
H. Hug
中科院分区：
文献类型：
--
作者：
S. Porthun;L. Abelmann;S.J.L. Vellekoop;J. Lodder;H. Hug
从[1]导出的尖端传递函数（TTF）开始，将使用最小可探测波长作为仪器横向分辨率的度量。这个最小可检测波长将决定仪器配置中的检测器噪声水平。然后利用最小可探测波长的模型从几何和磁力上优化尖端样品的配置。
Starting from the tip transfer function (TTF), as derived in [1], a minimum detectable wavelength will be used as a measure for the lateral resolution of the instrument. This minimum detectable wavelength will determine the detector noise level in the instrument’s configuration.The model of the minimum detectable wavelength is then used to optimize the tip-sample configuration geometrically as well as magnetically.