0.67-mu m(2)/bitcell two-transistor leakage-based physically unclonable function with native bit-instability of 0.89% at 65 nm
0.67-mu m(2)/bitcell two-transistor leakage-based physically unclonable function with native bit-instability of 0.89% at 65 nm
复制标题
0.67-μm2/bitcell%20双晶体管%20基于泄漏%20物理%20不可克隆%20功能%20with%20native%20位不稳定性%20of%200.89%%20at%2065%20nm
DOI：
10.1049/el.2020.1237
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发表时间：
2020
影响因子：
1.1
通讯作者：
Bo Chen
中科院分区：
文献类型：
--
作者：
Gang Li;Pengjun Wang;Xuejiao Ma;Bo Chen
提出了一种紧凑、鲁棒的物理不可克隆函数（PUF）用于安全密钥生成。在交叉耦合放大器的帮助下，两个晶体管之间的漏电流失配被数字化，以产生唯一的芯片标识。测量结果表明，所提出的PUF具有同类最佳的随机性和唯一性，以及以下特性：（i）具有159 F-2的最小特征尺寸的超小PUF单元，这是迄今为止在CMOS中报道的最低特征尺寸，在黄金条件下测得（比特不稳定性）为0.16%（0.89%），以及（iii）在95%置信度下实现了0.007的自相关性。
A compact and robust physically unclonable function (PUF) for secure key generation is proposed. With the help of a cross-coupled amplifier, the leakage-current mismatch between the two transistors was digitised to produce a unique chip identification. The measurement results show that the proposed PUF has the best-in-class randomness and uniqueness, as well as the following features: (i) an ultra-small PUF cell with a minimum feature size of 159 F-2, being the lowest reported to date in CMOS, (ii) a low native BER (bit-instability) of 0.16% (0.89%) was measured at the golden condition, and (iii) an autocorrelation of 0.007 at 95% confidence was achieved.