Quantitative evaluation of annular bright-field phase images in STEM
Quantitative evaluation of annular bright-field phase images in STEM
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DOI：
10.1093/jmicro/dfu113
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发表时间：
2015-04-01
期刊：
影响因子：
1.8
通讯作者：
Ikuta, Takashi
中科院分区：
文献类型：
--
作者：
Ishida, Takafumi;Kawasaki, Tadahiro;Ikuta, Takashi
利用图像仿真对基于多幅扫描透射电子显微镜（STEM）图像的相位重建方法进行了定量评价。模拟结果表明，单个原子引起的相移与原子序数Z的0.6次方成正比。对于薄的SrTiO 3 [001]晶体，在每个原子柱的重构相增加，根据试样厚度。如果厚度小于几纳米，则STEM相位图像可以量化氧空位浓度。
A phase reconstruction method based on multiple scanning transmission electron microscope (STEM) images was evaluated quantitatively using image simulations. The simulation results indicated that the phase shift caused by a single atom was proportional to the 0.6th power of the atomic number Z. For a thin SrTiO3 [001] crystal, the reconstructed phase at each atomic column increased according to the specimen thickness. The STEM phase images can quantify the oxygen vacancy concentration if the thickness is less than several nanometers.