Improvement of Magnetic Force Microscope Resolution and Application to High-Density Recording Media
Improvement of Magnetic Force Microscope Resolution and Application to High-Density Recording Media
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DOI：
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发表时间：
2013
影响因子：
2.1
通讯作者：
M. Futamoto;T. Hagami;S. Ishihara;K. Soneta;M. Ohtake
中科院分区：
文献类型：
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作者：
M. Futamoto;T. Hagami;S. Ishihara;K. Soneta;M. Ohtake
磁力显微镜(MFM)针尖是通过在半径为4 nm的非磁性硅针尖上涂覆磁性材料制成的。研究了磁性材料和涂层厚度对MFM分辨率和切换场的影响。MFM分辨率优于8 nm已被优化厚度的软磁或硬磁材料涂覆的TIP所确认。根据涂层材料和涂层厚度(10-80 nm)，开关场在0.1-3.0 kOe的较大范围内变化。高分辨率MFM探针被用于垂直和位图案化介质样品的磁化结构的观察。清晰地观察到尺度小于20 nm的磁化结构。
Magnetic force microscope (MFM) tips are prepared by coating magnetic materials on nonmagnetic Si tips with 4 nm radius. The effects of magnetic material and coating thickness on the MFM resolution and the switching field are investigated. MFM resolutions better than 8 nm have been confirmed with tips coated with soft magnetic or hard magnetic materials with optimized thicknesses. The switching field varies in a wide range 0.1-3.0 kOe depending on the coating material and the coating thickness (10-80 nm). High-resolution MFM tips are applied to the observations of magnetization structures of perpendicular and bit-patterned media samples. Magnetization structures of less than 20 nm in scale are clearly observed.