The accurate determination of crystal orientation from field ion micrographs
The accurate determination of crystal orientation from field ion micrographs
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从场离子显微照片精确测定晶体取向
DOI：
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发表时间：
1964
期刊：
影响因子：
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通讯作者：
D. Brandon
中科院分区：
文献类型：
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作者：
D. Brandon
场离子图像不能用标准的晶体投影来表示，而是非常接近于可以简单地用标准投影来定义的投影。这种特殊的投影取决于显微镜的几何形状，对于所采用的特殊几何形状，可以计算校正因子，以便将场离子图像转换为标准投影。由样品中的不对称性引起的图像失真可以通过绘制足够的晶面来平均化。该方法的总体准确度约为±2%。
The field-ion image cannot be represented by a standard crystallographic projection but approximates closely to a projection which may be simply defined in terms of the standard projections. This special projection depends on the microscope geometry and for the particular geometry employed correction factors can be calculated for converting the field-ion image to a standard projection. Distortions in the image due to asymmetries in the specimen can be averaged out by plotting sufficient crystal planes. The overall accuracy of the method is to about ±2%.