Extended model for the reconstruction of periodic multilayers from extreme ultraviolet and X-ray reflectivity data
Extended model for the reconstruction of periodic multilayers from extreme ultraviolet and X-ray reflectivity data
复制标题
根据极紫外和 X 射线反射率数据重建周期性多层的扩展模型
DOI:
10.1107/s1600576717012286
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发表时间:
2017
影响因子:
6.1
通讯作者:
Dmitry Gaman
中科院分区:
文献类型:
--
作者:
M. Svechnikov;D. E. Pariev;A. N. Nechay;N. Salashchenko;N. Chkhalo;Y. Vainer;Dmitry Gaman
An extended model for the reconstruction of multilayer nanostructures from reflectometry data in the X-ray and extreme ultraviolet ranges is proposed. In contrast to the standard model approach, where the transitional region is defined in advance as a specific function, the transition layer is sought as a linear combination of several functions at once in the extended model. This allows one to describe a much wider class of multilayer structures with different dominant physical mechanisms for the formation of transition regions. The extended model occupies an intermediate position between the classical model approach and the so-called model-free methods. The efficiency of the described method is illustrated in detail in numerical simulations and in a real experiment on the annealing of a multilayer Mo/Be mirror.
影响因子:
2.1
作者:
N.I. Chkhalo;D.E. Pariev;V.N. Polkovnikov;N.N. Salashchenko;R.A. Shaposhnikov;I.L. Stroulea;M.V. Svechnikov;Yu.A. Vainer;S.Yu. Zuev
通讯作者:
S.Yu. Zuev