Synthesis and electron-transport properties of N-trifluoromethylphenyl-phthalimides containing selenophene substituents
Synthesis and electron-transport properties of N-trifluoromethylphenyl-phthalimides containing selenophene substituents
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含硒酚取代基N-三氟甲基苯基邻苯二甲酰亚胺的合成及电子传输性能
DOI:
10.1039/d1ma00716e
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发表时间:
2021
影响因子:
5
通讯作者:
Takeshi Kawase
中科院分区:
文献类型:
--
作者:
Jun-ichi Nishida;Yoshiki Morikawa;Akito Hashimoto;Yasuyuki Kita;Hiroshi Nishimoto;Tomofumi Kadoya;Hiroyasu Sato;Takeshi Kawase
Trifluoromethylphenyl substituted phthalimides (PIs) containing oligoselenophene and phenylselenophene substituents were synthesized. Spectroscopic studies show that increasing the number of selenophene units causes the UV-Vis and photoluminescence maxima of the selenophene substituted PIs to shift to longer wavelengths. Analysis of the single crystal structure shows that the biselenophene substituted derivative has a layered structure, no center of symmetry and a molecular network with close contacts between Se atoms. XRD patterns of the PI derivatives indicate they have similar layered structures. These substances were used to fabricate field-effect transistors (FET)s by using the vapor deposition method. The FET derived using the biselenophene substituted PI exhibits clear n-type characteristics with an electron mobility of ca. 10−4 cm2 V−1 s−1. The FET prepared using the more highly conjugated terselenophene derivative also displays n-type FET characteristics with a slightly higher threshold voltage. Moreover, n-type behavior is also displayed by a highly crystalline thin film generated from the phenylselenophene derivative. The LED light responsiveness of FET characteristics was investigated. While the FET formed from the terselenophene derivative maintains a saturation drain–source current (IDS) operation along with a three-fold increase of electron mobility upon irradiation, those derived from the biselenophene and phenylselenophene derivatives display Ohm's law-like IDS. The difference in light responses are discussed in terms of conductivity differences.