Preparation and X-ray photoelectron spectroscopic characterization of Sn-doped C12A7:e(-) electride nanoparticles
Preparation and X-ray photoelectron spectroscopic characterization of Sn-doped C12A7:e(-) electride nanoparticles
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Sn掺杂C12A7:e(-)电子化合物纳米颗粒的制备及X射线光电子能谱表征
DOI：
10.1016/j.apsusc.2019.145244
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发表时间：
2020
影响因子：
6.7
通讯作者：
Song Weijie
中科院分区：
文献类型：
--
作者：
Hu Qiao;Tan Ruiqin;Yao Wenqing;Cui Yuanyuan;Li Jia;Song Weijie
由于电极的活性性质和掺杂剂的低原子浓度，了解电极纳米颗粒中掺杂剂的化学性质是必不可少的，也是具有挑战性的。在这项工作中，我们通过改进的溶胶-凝胶法制备了导电的sn掺杂C12A7:e−电极纳米粒子，并对掺杂电极纳米粒子的表面化学进行了全面的x射线光电子能谱表征。所得电极Ca12Al(14−x)Snx:e−(x = 1)的电子浓度为1.65 × 1021cm−3，比面积为53.9 m2/g。XPS结果表明，掺杂的C12A7:e−纳米粒子表面Sn以Sn4+形态存在。利用XPS氩+离子和氩簇离子溅射研究了元素的深度分布。结果表明，Sn在表面富集，溅射使Sn4+部分还原为金属Sn，而Ar簇离子溅射对Sn4+的还原效果要弱于Ar+离子溅射。溅射后Ca、Al、O元素的化学状态和分布没有明显变化。本研究为掺杂c12a7:e−纳米粒子的化学态分析提供了新的见解。
Understanding the chemistry of dopants in electride nanoparticles is essential and challenging owing to the active nature of the electride and the low atomic concentration of the dopants. In this work, we developed conductive Sn-doped C12A7:e−electride nanoparticles by a modified sol-gel method, and performed a comprehensive X-ray photoelectron spectroscopic characterization on the surface chemistry of the doped electride nanoparticles. The resulting electride Ca12Al(14−x)Snx:e−(x = 1) exhibited an electron concentration of 1.65 × 1021cm−3and a specific area of 53.9 m2/g. XPS results showed that Sn was in the form of Sn4+at the surface of the doped C12A7:e−nanoparticles. The depth distribution of elements was investigated by XPS Ar+ion and Ar cluster ion sputtering. Results showed that Sn was enriched at the surface and sputtering partially reduced Sn4+to metallic Sn, and Ar cluster ion sputtering showed much weaker effect on the reduction of Sn4+than the Ar+ion sputtering. The chemical states and distribution of elements Ca, Al, O did not show obvious change after sputtering. The present study provides novel insights on the chemical states analysis of doped-C12A7:e−nanoparticles.