Nonlinear microtearing modes in MAST and their stochastic layer formation
Nonlinear microtearing modes in MAST and their stochastic layer formation
复制标题
MAST 中的非线性微撕裂模式及其随机层形成
DOI:
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发表时间:
2023
影响因子:
2.2
通讯作者:
C. Roach
中科院分区:
文献类型:
--
作者:
M. Giacomin;D. Dickinson;D. Kennedy;B. Patel;C. Roach
First nonlinear gyrokinetic simulations of microtearing modes in the core of a MAST case are performed on two surfaces of the high-collisionality discharge used in Valovič et al (2011 Nucl. Fusion 51 073045) to obtain the favorable energy confinement scaling with collisionality, τE∝ν∗−1 . On the considered surfaces microtearing modes dominate linearly at binormal length scales of the order of the ion Larmor radius. While the effect of electron collision frequency is moderate in linear simulations, a strong dependence on this parameter is found in nonlinear simulations at r/a=0.5 , where r and a are the surface and tokamak minor radius, respectively. The dynamics of magnetic islands generated by microtearing modes is analysed, showing that the radial extent of the stochastic region caused by islands overlapping plays an important role in determining the saturation level of the microtearing mode driven heat flux. Local nonlinear gyrokinetic simulations show that the microtearing mode driven heat flux, QeMTM , is largely dominated by magnetic flutter and depends strongly on the magnetic shear, sˆ . Comparing two surfaces, r/a=0.5 and r/a=0.6 , reveals that QeMTM is negligible at r/a=0.5 ( sˆ=0.34 ), with the electron temperature gradient (ETG) driven heat flux, QeETG , comparable to the experimental electron heat flux, Qeexp , while QeMTM is significantly larger and comparable to QeETG and Qeexp at r/a=0.6 ( sˆ=1.1 ). Microtearing modes cause more experimentally significant transport in higher sˆ regions and may influence (together with ETG modes) the observed scaling of energy confinement time with collisionality (Valovič et al 2011 Nucl. Fusion 51 073045).
影响因子:
2.2
作者:
Colyer, G. J.;Schekochihin, A. A.;Dorland, W.
通讯作者:
Dorland, W.