Spectroscopic ellipsometry studies of CdS:O layers for solar cells
Spectroscopic ellipsometry studies of CdS:O layers for solar cells
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太阳能电池 CdS:O 层的光谱椭圆测量研究
DOI：
10.1143/jjap.50.05fc14
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发表时间：
2011
影响因子：
1.5
通讯作者：
I.Hasanov
中科院分区：
文献类型：
--
作者：
Y.Shim;J.Sakamoto;A.Suzuki;K.Khalilova;K.Wakita;N.Mamedov;A.Bavramov;E.Huseynovand;I.Hasanov
本文报道了用射频溅射方法在玻璃衬底上常温氧气存在下沉积的硫化镉薄膜的椭偏光谱研究结果。在1.5-5.0 eV的光子能量范围内，进行了数据采集和随后的线性回归分析以恢复介电函数。所得到的无氧硫化镉薄膜和参考块状硫化镉薄膜的介电功能谱非常相似。另一方面，在O/Ar比为5%的条件下沉积的CdS：O薄膜，其介电性能的主要结构发生了蓝移。尽管展宽发生在与跃迁相当的范围内，但事实证明，最后一个跃迁是如此之大，以至于在高于CDS能隙的光谱范围内提供了CDS：O薄膜的透明度。所获得的结果允许将CdS：O作为一种用于太阳能电池应用的改进的窗口层材料。
This work reports the results of spectroscopic ellipsometry study of CdS thin films, deposited on glass substrates in the presence of oxygen at room temperature by rf sputtering. The data acquisition, together with the subsequent linear regression analysis to restore dielectric function has been performed over the photon energy range 1.5–5.0 eV. The obtained oxygen-free CdS films and reference bulk CdS have been found to be very much the same regarding their dielectric function spectra. On the other hand, blue-shift of the main structures in dielectric function has been observed for CdS: O films deposited at 5% value of O/Ar ratio. In spite of the broadening taking place on a par with the shift, the last turns out to be so large that provides transparency of CdS: O thin films in a spectral range above the energy gap of CdS. The obtained results allow to considering CdS: O as an improved window-layer material for solar cell application.