Rhombohedral distortion analysis of ultra-thin Pt(111) films deposited under Ar-N2 atmosphere
Rhombohedral distortion analysis of ultra-thin Pt(111) films deposited under Ar-N2 atmosphere
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Ar-N2 气氛下沉积的超薄 Pt(111) 薄膜的菱面体畸变分析
DOI：
10.1107/s1600576714014484
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发表时间：
2014
影响因子：
6.1
通讯作者：
Ji Shi and Yoshio Nakamura
中科院分区：
文献类型：
--
作者：
Takashi Harumoto;Takumi Sannomiya;Shinji Muraishi;Ji Shi and Yoshio Nakamura
本文提出了一种用于分析旋转对称应力作用下（111）织构面心立方薄膜晶格畸变的菱面体分析方法。由于不需要材料常数，如衍射弹性常数，畸变的表达式，即角度和晶格参数，是通用的，可以很容易地用来比较不同的薄膜。利用这种菱面体畸变分析方法，系统地研究了氩氮气氛下沉积的（111）织构Pt薄膜，用菱面体晶胞的两个几何参数描述了沉积态和退火态薄膜中随厚度变化的晶格畸变。
A rhombohedral analysis method for analysing the lattice distortion in a (111)-textured face-centred cubic film under rotationally symmetric stress is proposed. Because no material constants, such as diffraction elastic constants, are required, the expressions of the distortion, namely the angle and the lattice parameter, are universal and can be readily used to compare different films. Using this rhombohedral distortion analysis method, (111)-textured Pt films deposited under argon–nitrogen atmosphere are systematically investigated, and the thickness-dependent lattice deformation in as-deposited and annealed films is described by the two geometrical parameters of the rhombohedral cell.