Analysis of high quality superconducting resonators: consequences for TLS properties in amorphous oxides
Analysis of high quality superconducting resonators: consequences for TLS properties in amorphous oxides
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DOI：
10.1088/0953-2048/29/4/044008
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发表时间：
2016-04-01
影响因子：
3.6
通讯作者：
Lindstrom, T.
中科院分区：
文献类型：
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作者：
Burnett, J.;Faoro, L.;Lindstrom, T.
由微观二能级系统（TLS）引起的1/f噪声对超导量子器件的性能非常有害，但人们对这些TLS的性质仍然知之甚少。最近的超导谐振器实验表明，在薄膜-衬底界面处的氧化物中的TLS之间的相互作用是不可忽略的。在这里，我们提出了两个不同的Nb谐振器的损失和1/f频率噪声的数据，并没有Pt盖帽和讨论可以得出什么结论TLS在非晶氧化物的属性。我们还估计了TLS的浓度和偶极矩。
1/f noise caused by microscopic two-level systems (TLS) is known to be very detrimental to the performance of superconducting quantum devices but the nature of these TLS is still poorly understood. Recent experiments with superconducting resonators indicates that interaction between TLS in the oxide at the film-substrate interface is not negligible. Here we present data on the loss and 1/f frequency noise from two different Nb resonators with and without Pt capping and discuss what conclusions can be drawn regarding the properties of TLS in amorphous oxides. We also estimate the concentration and dipole moment of the TLS.