Electron Diffraction Patterns of Fibrous and Lamellar Textured Polycrystalline Thin Films. I. Theory
Electron Diffraction Patterns of Fibrous and Lamellar Textured Polycrystalline Thin Films. I. Theory
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纤维状和层状织构多晶薄膜的电子衍射图案。
DOI：
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发表时间：
1996
期刊：
影响因子：
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通讯作者：
D. Laughlin
中科院分区：
文献类型：
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作者：
L. Tang;D. Laughlin
纤维状和层状织构多晶薄膜的倒易晶格分析的基础上的{hkl}家庭的平面与织构轴之间的不同的角度的数量。本文列出了所有晶系中任何给定方向/平面与给定平面族的所有面之间的这种不同角度的最大可能数量的表。基于这些倒易晶格，阐明了织构薄膜的平行和倾斜电子衍射图案特性。提出了一种织构薄膜弧面电子衍射图的标定方法。该方法适用于所有晶体结构的纤维状和层状织构薄膜。给出了衍射弧对向角与织构轴分布角之间的关系式。
The reciprocal lattices of fibrous and lamellar textured polycrystalline thin films are analyzed on the basis of the number of distinct angles made between planes of {hkl} families with the texture axis. Tables of the maximum possible number of such distinct angles between any given direction/plane and all faces of a given family of planes for all the crystal systems are included in this paper. Based on these reciprocal lattices, parallel and tilted electron-diffraction-pattern characteristics of the textured films are elucidated. A method of indexing the arced electron diffraction patterns of the textured films is proposed. This method can be applied to both the fibrous and lamellar texture films of all crystal structures. Formulas that relate the angles subtended by diffraction arcs to the distribution angle of the texture axis are presented.