CHARACTERIZATION OF ELECTRONIC STRUCTURE OF GRAIN BOUNDARIES IN CIGSSe AND CIGSSe ABSORBERS BY KELVIN PROBE FORCE MICROSCOPY
CHARACTERIZATION OF ELECTRONIC STRUCTURE OF GRAIN BOUNDARIES IN CIGSSe AND CIGSSe ABSORBERS BY KELVIN PROBE FORCE MICROSCOPY
复制标题
通过开尔文探针力显微镜表征 CIGSSe 和 CIGSSe 吸收剂中晶界的电子结构
DOI:
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发表时间:
2017
期刊:
影响因子:
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通讯作者:
Norio Terada
中科院分区:
文献类型:
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作者:
Shingo Kubo;Tsuyoshi Sawada;Takuya Shimamura;Takuya Kato;Hironori Sugimoto;Shogo Ishizuka,
Hajime Shibata;Koji Matsubara;Shigeru Niki;Norio Terada