Expected and unexpected plastic behavior at the micron scale: An in situ μLaue tensile study
Expected and unexpected plastic behavior at the micron scale: An in situ μLaue tensile study
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微米级的预期和意外塑性行为：原位 μLaue 拉伸研究
DOI：
10.1016/j.actamat.2011.10.058
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发表时间：
2012
期刊：
影响因子：
9.4
通讯作者：
G. Dehm
中科院分区：
文献类型：
--
作者：
C. Kirchlechner;P. Imrich;W. Grosinger;M. Kapp;J. Keckes;J. Micha;O. Ulrich;O. Thomas;S. Labat;C. Motz;G. Dehm
对微米和亚微米尺寸金属晶体力学性能的研究提出了尺寸对塑性不同方面影响的基本问题。加载过程中微观结构演变的现场表征对于理解晶体变形的物理基础是必要的。原位μLaue衍射能够提供存储位错类型和密度演变的独特统计信息。在对微米尺寸的单滑移取向铜试样进行原位μLaue拉伸试验时，我们展示了在低应变下宏观预期和意外的塑性行为。无论初始行为如何，都会达到稳定状态，从而达到微米级的技术屈服标准。
The study of mechanical properties in micron- and submicron-sized metal crystals raises fundamental questions about the influence of size on different aspects of plasticity. In situ characterization of the microstructure evolution during loading is necessary to understand the physics underlying crystal deformation. In situ μLaue diffraction is able to provide unique statistical information on the evolution of type and density of stored dislocations. Here we show macroscopically expected and unexpected plastic behavior at low strains, observed during in situ μLaue tensile tests on micron-sized, single slip oriented Cu samples. Regardless of the initial behavior, a steady state is reached which qualifies a technical yield criterion at the micron scale.
影响因子：
56.9
作者：
Csikor, Ferenc F.;Motz, Christian;Zapperi, Stefano
通讯作者：
Zapperi, Stefano