Optical properties of highly C-oriented Bi3TiNbO9 thin films grown on fused silica substrates by PLD
Optical properties of highly C-oriented Bi3TiNbO9 thin films grown on fused silica substrates by PLD
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DOI：
10.1007/s00339-004-2549-6
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发表时间：
2005-06
期刊：
影响因子：
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通讯作者：
B. Yang;Y. P. Wang;F. Wang;Y. Chen;S. Zhu;Z. Liu;W. Cao
中科院分区：
文献类型：
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作者：
B. Yang;Y. P. Wang;F. Wang;Y. Chen;S. Zhu;Z. Liu;W. Cao
使用脉冲激光沉积 (PLD) 在熔融石英基底上制备了高织构钙钛矿 Bi3TiNbO9(BTN) 薄膜。使用原子力显微镜 (AFM) 和 X 射线衍射测量薄膜表面和结构特性。确定了光学特性，例如透射率和折射率的波长依赖性。实验获得 Eg=3.55 eV 的带隙。通过使用棱镜耦合技术来表征光学特性。我们观察到清晰且可区分的横向电 (TE) 和横向磁 (TM) 多模，并测量了 BTN 薄膜在 632.8 nm 处的折射率。寻常折射率和非寻常折射率经计算为no=2.3528和ne=2.3942。这意味着 BTN 薄膜的双折射率为 Δn=ne-no=0.0414。这些结果显示了使用 BTN 薄膜作为电光活性材料的潜力。
Highly textured perovskite Bi3TiNbO9(BTN) thin films have been fabricated on fused silica substrates using pulsed laser deposition (PLD). Film surface and structural properties were measured by using atomic force microscopy (AFM) and X-ray diffraction. The optical properties, such as the wavelength dependence of the transmittance and the refractive index, were determined. A band gap of Eg=3.55 eV was obtained experimentally. Optical properties were characterized by using a prism-coupling technique. We observed sharp and distinguishable transverse electric (TE) and transverse magnetic (TM) multimodes and measured the refractive indices of BTN thin films at 632.8 nm. The ordinary and extraordinary refractive indices were calculated to be no=2.3528 and ne=2.3942. This means a birefringence of Δn=ne-no=0.0414 for BTN films. These results show the potential of using BTN films as an electro-optical active material.