Impurity precipitation in atomized particles evidenced by nano x-ray diffraction computed tomography
Impurity precipitation in atomized particles evidenced by nano x-ray diffraction computed tomography
复制标题
纳米 X 射线衍射计算机断层扫描证明雾化颗粒中的杂质沉淀
DOI：
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发表时间：
2014
期刊：
影响因子：
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通讯作者：
H. Palancher
中科院分区：
文献类型：
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作者：
A. Bonnin;Jonathan P. Wright;R. Tucoulou;H. Palancher
Performances and physical properties of high technology materials are influenced or even determined by their initial microstructure and by the behavior of impurity phases. Characterizing these impurities and their relations with the surrounding matrix is therefore of primary importance but it unfortunately often requires a destructive approach, with the risk of misinterpreting the observations. The improvement we have done in high resolution X-ray diffraction computed tomography combined with the use of an X-ray nanoprobe allows non-destructive crystallographic description of materials with microscopic heterogeneous microstructure (with a grain size between 10 nm and 10 μm). In this study, the grain localization in a 2D slice of a 20 μm solidified atomized γU-Mo particle is shown and a minority U(C,O) phase (1 wt. %) with sub-micrometer sized grains was characterized inside. Evidence is presented showing that the onset of U(C,O) grain crystallization can be described by a precipitation mechanism since one single U-Mo grain has direct orientation relationship with more than one surrounding U(C,O) grains.
