XeF2 photodissociation studies. I. Quantum yields and kinetics of XeF(B) and XeF(C)
XeF2 photodissociation studies. I. Quantum yields and kinetics of XeF(B) and XeF(C)
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XeF2 光解研究。
DOI：
10.1063/1.441920
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发表时间：
1981
影响因子：
4.4
通讯作者：
G. K. Walters
中科院分区：
文献类型：
--
作者：
G. Black;R. Sharpless;D. Lorents;D. Huestis;R. Gutcheck;T. Bonifield;D. A. Helms;G. K. Walters
用同步光脉冲（0.3 ns持续时间）光解XeF2已被用作XeF2（B、C和D）激发态的源。记录并部分分析了所得荧光强度的时间分辨曲线。大多数测量是在145和175 nm之间的强XeF2吸收带中进行的。在210 nm处重新测定吸收截面，在158 nm处的最大值为（5.9±0.5）×10−17 cm 2。通过与来自N2O光解离的O（1S）信号的比较，确定了XeF B、C和D态产生的量子产率。B和C态的辐射寿命分别为（14±1）和（100±10）ns。被XeF2淬灭的速率系数被报道为通过与Ne、Ar和N2碰撞将B转化为C的速率系数，沿着具有被这些气体淬灭C态的上限。
Photodissociation of XeF2 with synchrotron light pulses (0.3 ns duration) has been used as the source of the XeF(B, C, and D) excited states. The time‐resolved profiles of the intensity of the resulting fluorescence have been recorded and partially analyzed. Most of the measurements were made in the strong XeF2 absorption band between 145 and 175 nm. The absorption cross section was redetermined out to 210 nm, with a maximum value of (5.9±0.5)×10−17 cm2 at 158 nm. By comparison with O(1S) signals from N2O photodissociation, quantum yields for XeF B, C, and D state production were determined. Radiative lifetimes of (14±1) and (100±10) ns were found for the B and C states. Rate coefficients for quenching by XeF2 are reported as are those for converting B to C by collision with Ne, Ar, and N2, along with upper limits for quenching of the C state by these gases.