Electrical modification of a conductive polymer using a scanning probe microscope
Electrical modification of a conductive polymer using a scanning probe microscope
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使用扫描探针显微镜对导电聚合物进行电改性
DOI：
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发表时间：
2003
期刊：
影响因子：
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通讯作者：
M. Esashi
中科院分区：
文献类型：
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作者：
T. Ono;S. Yoshida;M. Esashi
我们已经证明了使用扫描探针显微镜（SPM）的数据存储的导电聚合物的电改性。将聚苯胺和聚甲基丙烯酸甲酯的共混物作为导电聚合物旋涂在硅基底上以制备测试样品。将导电SPM探针的尖端放置成与导电聚合物接触，并且通过在SPM探针和导电聚合物之间施加电压来进行电改性。电导图像和同步地形图像与SPM。结果发现，通过这种改性，电导率降低了20倍以上。形貌图像的测量显示改性区域的表面形貌没有明显变化。I-V特性的测量表明，在约3.2V的施加电压下发生化学反应。
We have demonstrated the electrical modification of a conductive polymer for data storage using a scanning probe microscope (SPM). A blend of polyaniline and polymethyl-methacrylate as the conductive polymer was spun on a silicon substrate to make a test specimen. The tip of a conductive SPM probe was placed in contact with the conductive polymer and electrical modification was carried out by applying a voltage between the SPM probe and the conductive polymer. The conductance image and a simultaneous topographic image were taken with the SPM. It was found that the electrical conductivity was decreased more than 20 times by this modification. Measurement of the topographic image shows no obvious change to the surface topography in the modified area. Measurement of the I–V characteristics suggests that a chemical reaction occurred at an applied voltage of about 3.2 V.