On a Combinatorial Framework for Fault Characterization
On a Combinatorial Framework for Fault Characterization
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DOI：
10.1007/s11786-018-0385-x
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发表时间：
2018-09
影响因子：
0.8
通讯作者：
C. Colbourn;V. Syrotiuk
中科院分区：
文献类型：
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作者：
C. Colbourn;V. Syrotiuk
覆盖阵列已广泛应用于大型软件和硬件系统的故障检测。实际上，发现由错误交互导致的失败需要所有可能导致错误的交互都包含在测试用例中。然而，查找实际的故障需要更多的时间，因为两组潜在故障导致的故障必须不同。开发了测试套件上的组合需求，使测试人员能够定位故障，并将其设置在类似的组合搜索问题的上下文中。被称为定位和检测阵列的测试套件在原理和实践上都是对覆盖阵列的推广，从而解决组合故障表征。与覆盖阵列一样，这些定位和检测阵列的大小随因子的数量呈对数比例，但与覆盖阵列不同，它们支持对潜在故障的相互作用的完整表征。
Covering arrays have been widely used to detect the presence of faults in large software and hardware systems. Indeed, finding failures that result from faulty interactions requires that all interactions that may cause faults be covered by a test case. However, finding the actual faults requires more, because the failures resulting from two potential sets of faults must not be the same. The combinatorial requirements on test suites to enable a tester to locate the faults are developed, and set in the context of similar combinatorial search questions. Test suites known as locating and detecting arrays to locate faults both in principle and in practice generalize covering arrays, thereby addressing combinatorial fault characterization. In common with covering arrays, these locating and detecting arrays scale logarithmically in size with the number of factors, but unlike covering arrays they support complete characterization of the interactions that underlie faults.