Frequency Selection of Sine Wave for Dynamic ADC Test

Frequency Selection of Sine Wave for Dynamic ADC Test
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动态 ADC 测试的正弦波频率选择

DOI:
10.2478/v10048-010-0035-1
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发表时间:
2010
期刊:
2008 IEEE Radio Frequency Integrated Circuits Symposium
影响因子:
--
通讯作者:
J. Roztocil
J. Roztocil
中科院分区:
--
文献类型:
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作者:
M. Komárek;J. Roztocil

文献摘要

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动态ADC测试中正弦波频率的选择本文讨论了时域和频域ADC测试中最佳频率的确定。所提出的用于选择测试信号频率的算法满足两个共同要求。第一个要求是获得最大数量的均匀分布在0和2π之间的采样值的不同相位;第二个要求是避免在第一奈奎斯特区混叠的高次谐波分量的重叠。利用MATLAB仿真和实际测量对算法进行了验证。
Frequency Selection of Sine Wave for Dynamic ADC Test The paper deals with determination of an optimum frequency for the time domain and frequency domain ADC testing. Proposed algorithm for selection of test signal frequency fulfills two common requirements. The first requirement is to get maximum quantity of distinct phases of the sampled values which are uniformly distributed between 0 and 2π; the second one is to avoid overlapping of higher harmonic components aliased in the first Nyquist zone. The algorithm was verified using MATLAB simulations and practical measurements.