The nanoscale phase distinguishing of PCL-PB-PCL blended in epoxy resin by tapping mode atomic force microscopy.
The nanoscale phase distinguishing of PCL-PB-PCL blended in epoxy resin by tapping mode atomic force microscopy.
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DOI：
10.1186/1556-276x-7-153
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发表时间：
2012-02-23
影响因子：
--
通讯作者：
Liang Q
中科院分区：
文献类型：
--
作者：
Li H;Sun L;Shen G;Liang Q
在这项工作中，我们通过轻敲模式原子力显微镜（TM-AFM）研究了聚（ε-己内酯）-聚丁二烯-聚（ε-己内酯）（PCL-PB-PCL）三嵌段共聚物在环氧树脂中的体相区分。我们发现，在设定点振幅比 (rsp) 小于或等于 0.85 时，使用力常数为 40 N/m 的探头可以获得清晰的相差。当rsp降低到0.1以下时，测得的富含PB的结构域的大小相对缩小；然而，在 rsp = 0.85 时，富含 PB 的域的高度图像将发生反转（从原始的亮色转换为暗色）。通过 TM-AFM 对相分离区域进行力探针测量。根据相移角与rsp曲线，可以得出结论，施加在环氧基体或富PB域上的不同力可能会导致高度和相位图像反转。此外，压痕深度与 rsp 的关系图表明，在较大的攻丝力（较低的 rsp）下，富含 PB 区域的压痕深度与环氧树脂基体几乎相同。
In this work, we investigated the bulk phase distinguishing of the poly(ε-caprolactone)-polybutadiene-poly(ε-caprolactone) (PCL-PB-PCL) triblock copolymer blended in epoxy resin by tapping mode atomic force microscopy (TM-AFM). We found that at a set-point amplitude ratio (rsp) less than or equal to 0.85, a clear phase contrast could be obtained using a probe with a force constant of 40 N/m. When rsp was decreased to 0.1 or less, the measured size of the PB-rich domain relatively shrank; however, the height images of the PB-rich domain would take reverse (translating from the original light to dark) at rsp = 0.85. Force-probe measurements were carried out on the phase-separated regions by TM-AFM. According to the phase shift angle vs. rsp curve, it could be concluded that the different force exerting on the epoxy matrix or on the PB-rich domain might result in the height and phase image reversion. Furthermore, the indentation depth vs. rsp plot showed that with large tapping force (lower rsp), the indentation depth for the PB-rich domain was nearly identical for the epoxy resin matrix.