The spectral response of X-ray CCDs in the energy band around Si-K edge: a solution to the Si-K edge problem for the XIS onboard Suzaku

The spectral response of X-ray CCDs in the energy band around Si-K edge: a solution to the Si-K edge problem for the XIS onboard Suzaku
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X射线CCD在Si-K边缘周围能带的光谱响应:朱雀机载XIS的Si-K边缘问题的解决方案

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发表时间:
2018
期刊:
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通讯作者:
Ken Ebisawa
Ken Ebisawa
中科院分区:
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文献类型:
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作者:
Koki Okazaki;Kiyoshi Hayashida;Hiroshi Nakajima;Riku Shomura;Tomokage Yoneyama;Hironori Matsumoto,Hiroshi Tsunemi;Koji Mori;Masahiro Tsujimoto;Yoshitomo Maeda;Ken Ebisawa

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