Compact Dictionaries for Reducing Compute Time in Adaptive Diagnosis
Compact Dictionaries for Reducing Compute Time in Adaptive Diagnosis
复制标题
用于减少自适应诊断中的计算时间的紧凑字典
DOI：
10.1109/itc-cscc.2019.8793429
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发表时间：
2019
期刊：
影响因子：
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通讯作者：
Kewal K Saluja
中科院分区：
文献类型：
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作者：
Yoshinobu Higami;Tomokazu Nakamura;Tsutomu Inamoto;Senling Wang;Hiroshi Takahashi;Kewal K Saluja
现场测试和现场诊断是实现现代系统高可靠性的有效途径。由于它们是在系统的空闲模式或启动模式期间执行的，因此它们必须在非常短的时间内完成。自适应诊断根据故障诊断过程中得到的候选故障集有选择地应用测试模式。在本文中，我们提出了一种自适应故障诊断方法，使用一个紧凑的字典，以减少计算时间推断候选故障。压缩字典是通过将一些输出值压缩到一个位来创建的。虽然使用紧凑字典减少了计算时间，但在某些情况下，用于诊断的应用测试模式的数量可能会增加。通过对基准电路的实验，我们研究了压缩字典的大小、计算时间和测试模式数之间的关系。
Field testing and field diagnosis are effective ways for achieving high reliability of modern systems. Since they are executed during an idle mode or a start-up mode in a system, they must be completed within very short time. Adaptive diagnosis applies test patterns selectively according to a candidate faults set that is obtained during the fault diagnosis process. In this paper, we propose an adaptive fault diagnosis method using a compact dictionary in order to reduce compute time for deducing candidate faults. A compact dictionary is created by compacting some output values into one bit. Although the compute time is reduced using a compact dictionary, the number of applied test patterns for diagnosis may increase in some cases. We investigate the relation between the size of a compact dictionary, compute time and the number of test patterns by experiments for benchmark circuits.