Carrier–envelope phase-tagged imaging of the controlled electron acceleration from SiO2 nanospheres in intense few-cycle laser fields
Carrier–envelope phase-tagged imaging of the controlled electron acceleration from SiO2 nanospheres in intense few-cycle laser fields
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DOI：
10.1088/1367-2630/14/7/075010
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发表时间：
2012-07
影响因子：
3.3
通讯作者：
S. Zherebtsov;F. Süßmann;C. Peltz;J. Plenge;K. J. Betsch;I. Znakovskaya;A. Alnaser;N. G. Johnson-
中科院分区：
文献类型：
--
作者：
S. Zherebtsov;F. Süßmann;C. Peltz;J. Plenge;K. J. Betsch;I. Znakovskaya;A. Alnaser;N. G. Johnson-
波形控制光场提供了在子周期时间尺度上操纵超快电子过程的可能性。纳米结构材料中集体电子运动的光学光波控制是设计在高达千兆赫频率下工作的电子器件的关键。我们已经研究了在几个周期的激光场与一个定义良好的波形从95 nm直径的SiO2纳米粒子的电子发射的方向控制。三维（3D）电子动量分布的投影通过单次拍摄速度图成像（VMI）获得，其中相位标记允许检索每个激光发射的激光波形。这种技术的应用使我们能够有效地抑制数据中的背景贡献，并获得非常准确的信息的振幅和相位的波形相关的电子发射。将中心波长为720 nm的4 fs脉冲在（1-4）× 1013 W cm−2范围内不同强度下获得的实验数据与准经典平均场蒙特-卡罗模拟进行了比较。模型计算确定电子背散射从纳米粒子表面在高度动态的局部领域的主要过程负责的高能电子发射的纳米粒子。在我们的研究中观察到的电子发射的局部场敏感性可以作为未来研究的基础上传播的影响较大的粒子和场诱导的材料变化在更高的强度。
Waveform-controlled light fields offer the possibility of manipulating ultrafast electronic processes on sub-cycle timescales. The optical lightwave control of the collective electron motion in nanostructured materials is key to the design of electronic devices operating at up to petahertz frequencies. We have studied the directional control of the electron emission from 95 nm diameter SiO2 nanoparticles in few-cycle laser fields with a well-defined waveform. Projections of the three-dimensional (3D) electron momentum distributions were obtained via single-shot velocity-map imaging (VMI), where phase tagging allowed retrieving the laser waveform for each laser shot. The application of this technique allowed us to efficiently suppress background contributions in the data and to obtain very accurate information on the amplitude and phase of the waveform-dependent electron emission. The experimental data that are obtained for 4 fs pulses centered at 720 nm at different intensities in the range (1–4) × 1013 W cm−2 are compared to quasi-classical mean-field Monte-Carlo simulations. The model calculations identify electron backscattering from the nanoparticle surface in highly dynamical localized fields as the main process responsible for the energetic electron emission from the nanoparticles. The local field sensitivity of the electron emission observed in our studies can serve as a foundation for future research on propagation effects for larger particles and field-induced material changes at higher intensities.