Design of SIW-Based Multi-Aperture Couplers Using Ray Tracing Method
Design of SIW-Based Multi-Aperture Couplers Using Ray Tracing Method
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DOI：
10.1109/tcpmt.2016.2626382
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发表时间：
2017
期刊：
影响因子：
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通讯作者：
Zheng Liu;G. Xiao
中科院分区：
文献类型：
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作者：
Zheng Liu;G. Xiao
本文采用一种简化的光线追迹法近似计算了H面多孔基片集成波导耦合器的耦合特性。输出端口的输出功率由耦合窗口处的反射和透射系数计算。光线追迹法为基片集成波导多孔径耦合器几何参数的初始值确定提供了一种简单有效的方法。从这些初始值出发，可以以较少的迭代次数快速优化耦合器的结构，从而大大提高设计效率。为了获得高的隔离度，引入了一个准则，以防止在SIW中激发高阶传播Floquet模式。用我们的方法设计了三个多孔径耦合器的例子。实测结果与模拟结果及射线追踪法预测结果吻合较好。
In this paper, a simplified ray tracing method is used to approximately predict the coupling characteristics of H-plane multi-aperture substrate integrated waveguide (SIW) couplers. The output powers of the output ports are calculated with the reflection and the transmission coefficients at the coupling windows. The ray tracing method provides a simple and efficient way to determine the initial values for the geometrical parameters of SIW-based multi-aperture couplers. From these initial values, the structures of the couplers can be quickly optimized with less iterations, so that the design efficiency can be greatly improved. In order to get high isolation, a criterion is introduced to prevent exciting higher order propagating Floquet modes in the SIWs. Three examples of multi-aperture couplers are designed with our approach. The measured results agree well with the simulated results and the ones predicted using the ray tracing method.