Avoiding Pitfalls in Fault-Injection Based Comparison of Program Susceptibility to Soft Errors
Avoiding Pitfalls in Fault-Injection Based Comparison of Program Susceptibility to Soft Errors
复制标题
避免基于故障注入的程序对软错误的敏感性比较中的陷阱
DOI:
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发表时间:
2015
期刊:
影响因子:
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通讯作者:
O. Spinczyk
中科院分区:
文献类型:
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作者:
Horst Schirmeier;C. Borchert;O. Spinczyk
Since the first identification of physical causes for soft errors in memory circuits, fault injection (FI) has grown into a standard methodology to assess the fault resilience of computer systems. A variety of FI techniques trying to mimic these physical causes has been developed to measure and compare program susceptibility to soft errors. In this paper, we analyze the process of evaluating programs, which are hardened by software-based hardware fault-tolerance mechanisms, under a uniformly distributed soft-error model. We identify three pitfalls in FI result interpretation widespread in the literature, even published in renowned conference proceedings. Using a simple machine model and transient single-bit faults in memory, we find counterexamples that reveal the unfitness of common practices in the field, and substantiate our findings with real-world examples. In particular, we demonstrate that the fault coverage metric must be abolished for comparing programs. Instead, we propose to use extrapolated absolute failure counts as a valid comparison metric.