The use of sediment profile imaging (SPI) for environmental impact assessments and monitoring studies: Lessons learned from the past four decades
The use of sediment profile imaging (SPI) for environmental impact assessments and monitoring studies: Lessons learned from the past four decades
复制标题
使用沉积物剖面成像 (SPI) 进行环境影响评估和监测研究：过去四十年的经验教训
DOI：
--
复制
发表时间：
2011
期刊：
影响因子：
--
通讯作者：
M. Solan
中科院分区：
文献类型：
--
作者：
J. Germano;D. Rhoads;R. Valente;D. Carey;M. Solan
自 1969 年以来，沉积物剖面成像 (SPI) 技术已以某种形式用于研究近地表水生沉积物的结构和外观。对图像中的模式及其与生物、物理和化学相互作用介导的海底过程的关系的识别是由对沉积结构和地质记录中生物群落证据感兴趣的学术科学家开创的。 SPI 技术在环境评估中的应用恰逢海洋底栖群落对精细沉积生境干扰的反应的可靠理论的发展和测试。海底沉积物图像中可见的图案与通过操纵实验和现场观察受干扰的细小沉积物的重新定殖相关的过程有关。这些模式与受干扰栖息地恢复阶段的关联为 SPI 作为环境评估和监测调查的工具提供了基础。经过近 40 年 SPI 技术在环境评估和监测中的应用，我们可以总结该技术的优点和缺点。本文介绍了仪器发展和图像判读的历史，讨论了该方法的技术局限性和优点，总结了 SPI 技术的应用范围，并考虑了该技术、支持理论和应用的未来可能的发展方向。
Sediment profile imaging (SPI) technology has been used in some form since 1969 to investigate the structure and appearance of near-surface aquatic sediments. The recognition of patterns in images and their relationship to seafloor processes mediated by biological, physical and chemical interactions was pioneered by academic scientists interested in sedimentary structures and evidence of biological communities in the geological record. The application of SPI technology to environmental assessment coincided with the development and testing of a robust theory of marine benthic community responses to disturbance in fine sedimentary habitats. The patterns visible in the images of seafloor sediments were related to processes associated with the recolonization of disturbed fine sediments through manipulation experiments and field observations. Association of these patterns with stages in the recovery of disturbed habitats provided the basis for SPI as a tool for environmental assessment and monitoring surveys. After almost 40 years of application of SPI technology to environmental assessment and monitoring, we are in a position to summarize the strengths and weaknesses of this technology. This review describes the history of instrument development and image interpretation, discusses the technical limitations and advantages of the method, summarizes the range of applications of SPI technology, and considers possible future directions for the technology, supporting theory, and application.