Numerical Simulation of Shielding Current Density in High-Temperature Superconducting Film : Influence of Film Edge on Permanent Magnet Method
Numerical Simulation of Shielding Current Density in High-Temperature Superconducting Film : Influence of Film Edge on Permanent Magnet Method
复制标题
高温超导薄膜中屏蔽电流密度的数值模拟：薄膜边缘对永磁法的影响
DOI：
10.1109/tmag.2011.2175373
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发表时间：
2012
期刊：
影响因子：
--
通讯作者：
T. Takayama
中科院分区：
文献类型：
--
作者：
A. Kamitani;T. Takayama
提出了一种分析高温超导薄膜屏蔽电流密度的数值方法。当高温超导薄膜含有裂纹时，在裂纹表面附加一个边界条件，并将其并入弱形式。虽然弱形式可以用本质边界条件进行数值求解，但得到的解并不完全满足裂纹面上的法拉第定律。为了解决这一问题，提出了如下方法：在裂纹周围加一个虚拟电压，使法拉第定律在数值上满足。在此基础上开发了分析屏蔽电流密度的数值程序，并利用该程序对永磁法进行了数值研究。特别是，评估了胶片边缘或裂纹对精度的影响。
A numerical method is developed for analyzing the shielding current density in a high-temperature superconducting (HTS) film. When an HTS film contains a crack, an additional boundary condition is imposed on the crack surface and it can be incorporated into the weak form. Although the weak form can be numerically solved with the essential boundary conditions, the resulting solution does not exactly satisfy Faraday's law on the crack surface. In order to resolve this problem, the following method is proposed: a virtual voltage is applied around the crack so as to make Faraday's law satisfied numerically. A numerical code for analyzing the shielding current density is developed on the basis of the proposed method and, by means of the code, the permanent magnet method is investigated numerically. Especially, the influence of a film edge or a crack on accuracy is assessed.