Localized Defects on Copper Sulfide Surface for Enhanced Plasmon Resonance and Water Splitting
Localized Defects on Copper Sulfide Surface for Enhanced Plasmon Resonance and Water Splitting
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硫化铜表面的局部缺陷增强等离子共振和水分解
DOI：
10.1002/smll.201700867
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发表时间：
2017
期刊：
影响因子：
13.3
通讯作者：
Du Xiwen
中科院分区：
文献类型：
--
作者：
Ren Kaixv;Yin Pengfei;Zhou Yuzhu;Cao Xingzhong;Dong Cunku;Cui Lan;Liu Hui;Du Xiwen
半导体中的表面缺陷会导致高密度的载流子，并引起局域表面等离子体共振，容易产生光捕获和能量转换，而内部缺陷则会导致电子和空穴的严重复合。因此，精确地控制缺陷的分布是重要的，尽管很少有成功的例子。在此，报道了一种有效的策略，以限制在Cu1.94S纳米片阵列（NFA）的表面层内的丰富的缺陷，留下一个完美的内部结构。然后将Cu1.94S NFA应用于光电化学（PEC）水裂解。正如所料，表面缺陷引起强烈的LSPR效应和快速的电荷分离附近的表面，同时，它们提供催化析氢的活性位点。因此，NFA实现了CuxS基光电阴极有史以来报道的最高PEC性能。
Surficial defects in semiconductor can induce high density of carriers and cause localized surface plasmon resonance which is prone to light harvesting and energy conversion, while internal defects may cause serious recombination of electrons and holes. Thus, it is significant to precisely control the distribution of defects, although there are few successful examples. Herein, an effective strategy to confine abundant defects within the surface layer of Cu1.94S nanoflake arrays (NFAs) is reported, leaving a perfect internal structure. The Cu1.94S NFAs are then applied in photoelectrochemical (PEC) water splitting. As expected, the surficial defects give rise to strong LSPR effect and quick charge separation near the surface; meanwhile, they provide active sites for catalyzing hydrogen evolution. As a result, the NFAs achieve the top PEC properties ever reported for CuxS‐based photocathodes.