EFFECT OF CLUSTER SURFACE ENERGIES ON SECONDARY-ION-INTENSITY DISTRIBUTIONS FROM IONIC-CRYSTALS
EFFECT OF CLUSTER SURFACE ENERGIES ON SECONDARY-ION-INTENSITY DISTRIBUTIONS FROM IONIC-CRYSTALS
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DOI：
10.1103/physrevlett.47.1046
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发表时间：
1981-01-01
影响因子：
8.6
通讯作者：
DUNLAP, BI
中科院分区：
文献类型：
--
作者：
CAMPANA, JE;BARLAK, TM;DUNLAP, BI
用氙离子轰击CSI产生了[M(MX)n]+型超高质量团簇离子(mz>；18000)，并用高性能二次离子质谱仪进行了探测。质谱图(离子强度与n的关系)显示出反常行为，这与假设的具有低表面能的立方状团簇的优势有关。
Ultrahigh-mass cluster ions (m z> 18 000) of the type [M (MX) n]+ have been produced by xenon-ion bombardment of CsI and detected by a high-performance secondary-ion mass spectrometer. The mass spectra (ion intensity versus n) show anomalous behavior which is correlated with hypothesized dominance of cubiclike clusters having low surface energies.