Picosecond nonlinear refraction measurement in single-beam open Z scan by charge-coupled device image processing.
Picosecond nonlinear refraction measurement in single-beam open Z scan by charge-coupled device image processing.
复制标题
通过电荷耦合器件图像处理进行单光束开放 Z 扫描中的皮秒非线性折射测量。
DOI：
10.1364/ol.21.000101
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发表时间：
1996
期刊：
影响因子：
3.6
通讯作者：
D. Métin
中科院分区：
文献类型：
--
作者：
A. Marcano O.;H. Maillotte;D. Gindre;D. Métin
我们提出了一个皮秒单光束开放Z扫描实验中，通常的光圈检测方案是由一个二维单次拍摄的CCD相机取代。这使我们能够提取的二维横向修改的整个远场图案，是由于非线性折射，以及测量感应的非线性相移与传统的Z扫描相比，灵敏度增加。
We propose a picosecond single-beam open Z-scan experiment in which the usual apertured detection scheme is replaced by a two-dimensional single-shot CCD camera. This enables us to extract the two-dimensional transverse modifications of the whole far-f ield pattern that are due to nonlinear refraction as well as to measure the induced nonlinear phase shift with increased sensitivity compared with that of the conventional Z scan.