A library based on deep neural networks for modeling the degradation of FinFET SRAM performance metrics due to aging
A library based on deep neural networks for modeling the degradation of FinFET SRAM performance metrics due to aging
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DOI：
10.1016/j.microrel.2019.113486
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发表时间：
2019-09
影响因子：
1.6
通讯作者：
Rui Zhang;Zhaocheng Liu;Kexin Yang;Taizhi Liu;W. Cai;L. Milor
中科院分区：
文献类型：
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作者：
Rui Zhang;Zhaocheng Liu;Kexin Yang;Taizhi Liu;W. Cai;L. Milor
