Sensitivity-enhanced reflection Z-scan by oblique incidence of a polarized beam
Sensitivity-enhanced reflection Z-scan by oblique incidence of a polarized beam
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DOI：
10.1063/1.120584
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发表时间：
1998-06
影响因子：
4
通讯作者：
M. Martinelli;S. Bian;J. Leite;R. Horowicz
中科院分区：
文献类型：
--
作者：
M. Martinelli;S. Bian;J. Leite;R. Horowicz
我们展示了一种新的实验方法，它可以高灵敏度地测量吸收介质中的非线性光学折射率。在这项技术中，测量了接近布鲁斯特角的偏振高斯激光光束的反射。对于光学晶体，观察到相对于其他技术的灵敏度增强系数为30，并且可以获得更高的值。
We demonstrate a new experimental method which allows the measurement of the nonlinear optic index in absorptive media with great sensitivity. In this technique the reflection from a polarized Gaussian laser beam close to the Brewster angle is measured. A sensitivity enhancement factor of 30 with respect to other techniques is observed for an optical crystal, and higher values are possible to be obtained.