Yield and leakage current of organic thin-film transistor logic gates toward reliable and low-power operation of large-scale logic circuits for IoT nodes
Yield and leakage current of organic thin-film transistor logic gates toward reliable and low-power operation of large-scale logic circuits for IoT nodes
复制标题
有机薄膜晶体管逻辑门的良率和漏电流，以实现物联网节点大规模逻辑电路的可靠和低功耗运行
DOI：
10.35848/1347-4065/ac44cf
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发表时间：
2022
影响因子：
1.5
通讯作者：
Sato Takashi
中科院分区：
文献类型：
--
作者：
Ogasahara Yasuhiro;Kuribara Kazunori;Oshima Kunihiro;Qin Zhaoxing;Sato Takashi
