Discrimination of Aluminum from Silicon by Electron Crystallography with the JUNGFRAU Detector
Discrimination of Aluminum from Silicon by Electron Crystallography with the JUNGFRAU Detector
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DOI：
10.3390/cryst10121148
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发表时间：
2020-12-01
期刊：
影响因子：
2.7
通讯作者：
Gruene, Tim
中科院分区：
文献类型：
--
作者：
Frojdh, Erik;Wennmacher, Julian T. C.;Gruene, Tim
化合物的晶体结构有几个目的：它的坐标代表关于原子之间连接的三维信息;它是确定手性分子绝对构型的唯一技术;它可以确定结构-功能关系;原子分辨率的晶体学数据区分元素类型并作为合成方案的确认。在这里，我们收集的电子衍射数据从钠长石和林德A型（LTA）型沸石。这两种化合物都是具有明确的硅和铝晶体位置的铝硅酸盐。用Aramis用户站的“adJUStiNg增益探测器”（JUNGFRAU探测器）记录数据，我们利用其能量鉴别能力来抑制噪声。对于这两种化合物，晶体学精确区分硅和铝，即使这些元素具有非常相似的电子散射因子。这些结果突出了电子衍射数据的质量和化学解释模型的可靠性。这一方向的进一步发展将为衍射结构-功能研究提供巨大的机会。
The crystal structure of a chemical compound serves several purposes: its coordinates represent three-dimensional information about the connectivity between the atoms; it is the only technique that determines the absolute configuration of chiral molecules; it enables determining structure-function relations; and crystallographic data at atomic resolution distinguish between element types and serve as a confirmation of synthesis protocols. Here, we collected electron diffraction data from albite and from a Linde Type A (LTA) type zeolite. Both compounds are aluminosilicates with well-defined silicon and aluminum crystallographic sites. Data were recorded with the "adJUstiNg Gain detector FoR the Aramis User station" (JUNGFRAU detector) and we made use of its capability of energy discrimination to suppress noise. For both compounds, crystallographic refinement distinguishes correctly between silicon and aluminum, even though these elements have very similar electron scattering factors. These results highlight the quality of the electron diffraction data and the reliability of the models for chemical interpretation. Further development in this direction will provide enormous opportunities for structure-function studies by diffraction.