Limits of imaging resolution for atomic force microscopy of molecules
Limits of imaging resolution for atomic force microscopy of molecules
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分子原子力显微镜成像分辨率的限制
DOI：
10.1063/1.105649
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发表时间：
1991
影响因子：
4
通讯作者：
J. Pethica
中科院分区：
文献类型：
--
作者：
T. Weihs;Z. Nawaz;S. Jarvis;J. Pethica
与Langmuir-Blodgett（LB）膜接触操作的原子力显微镜的成像分辨率被预测为所施加的力，尖端半径，粘附力，和尖端和膜特性的函数。的LB膜的弹性模量和硬度进行测量，使用纳米压痕仪和成像分辨率预测使用一个简单的赫兹弹性分析和一个，其中包括尖端和样品之间的粘附力。对于较小的作用力（<1 nN），随着针尖半径和粘附力的减小，分辨率急剧提高。然而，非弹性变形的开始限制了最尖锐尖端的分辨率。
The imaging resolution of an atomic force microscope operating in contact with a Langmuir–Blodgett (LB) film is predicted as a function of applied force, tip radius, adhesive force, and tip and film properties. The elastic modulus and the hardness of the LB film were measured using a nanoindenter and the imaging resolution is predicted using both a simple Hertzian elastic analysis and one that includes adhesive forces between the tip and the sample. For a small applied force (<1 nN) the resolution improves sharply as the tip radius and the adhesive force decrease. The onset of inelastic deformation, however, limits the resolution of the sharpest tips.