A non-invasive beam profile monitor for charged particle beams
A non-invasive beam profile monitor for charged particle beams
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DOI：
10.1063/1.4879285
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发表时间：
2014-05-19
影响因子：
4
通讯作者：
Welsch, Carsten P.
中科院分区：
文献类型：
--
作者：
Tzoganis, Vasilis;Welsch, Carsten P.
在几乎所有的粒子加速器中，非拦截光束剖面监测器都是非常理想的。这种技术在需要实时监测光束特性的应用中特别有价值，而光束保存和对真空的最小影响是最重要的。这适用于许多类型的加速器，例如高能机器，其中正常诊断无法承受光束的功率，医疗机器，治疗时间是宝贵的，不能分配给诊断，以及低能量，低强度加速器，其中光束的性质难以测量。本文介绍了一种基于气体射流的光束剖面监测仪的设计，该监测仪由Cockcroft研究所开发并投入使用，可以在10（-7）到10（-11）毫巴的大背景压力范围内工作。介绍了监测器的工作原理，并讨论了在5kev电子束下获得的初步实验结果。(C) 2014 AIP出版有限责任公司
Non-interceptive beam profile monitors are highly desirable in almost all particle accelerators. Such techniques are especially valuable in applications where real time monitoring of the beam properties is required while beam preservation and minimal influence on the vacuum are of the greatest importance. This applies to many kinds of accelerators such as high energy machines where the normal diagnostics cannot withstand the beam's power, medical machines where treatment time is valuable and cannot be allocated to diagnostics and also low energy, low intensity accelerators where the beam's properties are difficult to measure. This paper presents the design of a gas-jet based beam profile monitor which was developed and commissioned at the Cockcroft Institute and can operate in a very large background pressure range from 10(-7) down to below 10(-11) millibars. The functioning principle of the monitor is described and the first experimental results obtained using a 5 keV electron beam are discussed. (C) 2014 AIP Publishing LLC.