Mechanisms of charging in electron spectroscopy
Mechanisms of charging in electron spectroscopy
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DOI：
10.1016/s0368-2048(99)00068-7
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发表时间：
1999-12-01
影响因子：
1.9
通讯作者：
Cazaux, J
中科院分区：
文献类型：
--
作者：
Cazaux, J
从使用的物理参数的基础上经典的静电学和基本的固态物理，在绝缘材料的充电机制中所涉及的各种参数的作用进行了详细分析，当这些绝缘试样进行了调查，通过表面分析技术（主要是XPS和电子（-）AES）。次表面的组成和结构的作用进行了概述，并指出充电效应和一些辐射损伤效应之间的强相关性。还推导出一些策略，以尽量减少这些影响。(C)1999 Elsevier Science B. V.保留所有权利。
From the use of physical arguments based on classical electrostatics and elementary solid state physics, the role of the various parameters involved in the charging mechanisms of insulating materials is analysed in detail when these insulating specimens are investigated by surface analytical techniques (mainly XPS and e(-)AES). The role of the sub-surface composition and structure is outlined and the strong correlations between charging effects and some radiation damage effects are pointed out. Some strategies are also deduced to minimise these effects. (C) 1999 Elsevier Science B.V. All rights reserved.