Characterization of two-level system noise for a microwave kinetic inductance detector comprising niobium film on a silicon substrate
Characterization of two-level system noise for a microwave kinetic inductance detector comprising niobium film on a silicon substrate
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硅衬底上包含铌薄膜的微波动感电感探测器的两级系统噪声表征
DOI：
10.1093/ptep/ptac023
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发表时间：
2022
影响因子：
3.5
通讯作者：
Tajima O
中科院分区：
文献类型：
--
作者：
Sueno Y;Honda S;Kutsuma H;Mima S;Otani C;Oguri S;Suzuki J;Tajima O
微波动态电感探测器（MKID）是一种前沿的超导探测器。它包括一个谐振器电路，该谐振器电路由电介质衬底上的超导膜构成。为了扩大其应用领域，重要的是要建立一种方法来抑制两个能级系统（TLS）的噪声是由两个能量状态之间的电波动在衬底的表面所造成的。在MKID电路中，通过从接地平面（W）扩大带宽度（S）和间隙宽度，可以降低电场密度，从而允许抑制TLS噪声。然而，这种效果尚未得到证实的MKID与铌膜在硅基板上。在这项研究中，我们证明了它对这种MKID的有效性。将电路尺寸从（S，W）=（3.00 μ m，4.00 μm）扩展到（S，W）=（5.00 μ m，23.7 μm），对TLS噪声的抑制提高了5.5dB。
A microwave kinetic inductance detector (MKID) is a cutting-edge superconducting detector. It comprises a resonator circuit constructed with a superconducting film on a dielectric substrate. To expand its field of application, it is important to establish a method to suppress the two-level system (TLS) noise that is caused by the electric fluctuations between the two energy states at the surface of the substrate. The electric field density can be decreased by expanding the strip width (S) and gap width from the ground plane (W) in the MKID circuit, allowing the suppression of TLS noise. However, this effect has not yet been confirmed for MKIDs made with niobium films on silicon substrates. In this study, we demonstrate its effectiveness for such MKIDs. We expanded the dimension of the circuit from (S, W) = (3.00 μm, 4.00 μm) to (S, W) = (5.00 μm, 23.7 μm), and achieved an increased suppression of 5.5 dB in TLS noise.