Retrieving the size of particles with rough surfaces from 2D scattering patterns

Retrieving the size of particles with rough surfaces from 2D scattering patterns
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从 2D 散射图案中检索表面粗糙的颗粒尺寸

DOI：
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发表时间：
2011
期刊：
影响因子：
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通讯作者：
R. Greenaway
R. Greenaway
中科院分区：
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文献类型：
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作者：
Z. Ulanowski;P. Kaye;E. Hirst;R. Greenaway

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正常0散射强度测量是用于确定小颗粒尺寸的常用方法。然而，它需要校准，并且由于入射辐照度或检测器灵敏度的变化而受到误差的影响。二维散射模式的分析提供了另一种方法。我们测试可能的技术，包括形态学图像处理操作，在不同范围的颗粒。发现强度峰的平均表面积与颗粒尺寸成反比。
Normal 0 Scattered intensity measurement is a commonly used method for determining the size of small particles. However, it requires calibration and is subject to errors due to changes in incident irradiance or detector sensitivity. Analysis of two-dimensional scattering patterns offers an alternative approach. We test possible techniques, including morphological image processing operations, on a diverse range of particles. It is found that the average surface area of intensity peaks is inversely proportional to particle size.